Fabrication Facilities
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Molecular-beam epitaxy system
Type: Material growth equipment
Function: The system can grow atomically flat thin film and nano-structures of semiconductors in ultra-high vacuum environment.
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Electron-beam lithography system
Type: Material fabrication equipment
Function: The system can draw designed shapes on a surface covered with resist. The pattern of resist that can subsequently be transferred to the substrate material by etching.
Optics Labs
Cryostats
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Montana system
Type: Characterization setup
Function: The setup can provide a stable measurement environment from 3.2K to 350K with low thermal fluctuations and nanometer level vibrations.
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attoDRY800 system
Type: Characterization setup
Function: The system can provide a stable measurement environment from 3.8K to 320K and the magnetic field on sample to 9T.
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attoCube800 system
Type: Characterization setup
Function: A mobile cryostation with an integrated optical breadboard. Can cool down to 3.8K.
Lasers
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M Squared laser system
Type: Laser
Function: The system can produce continuous-wave, ultra-narrow linewidth laser from 725nm to 975nm.
![[Translate to English:] AG Ding](/fileadmin/fkp/AG_Ding/Labore/______4-2.jpg)
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Coherent laser system (Chameleon)
Type: Laser
Function: The system can produce pulse laser from 680nm to 1080nm with the width of 140fs.
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Coherent laser system (Mira + OPO-X)
(copy 2)
Type: Laser
Function: This modelocked laser system can generate ~2ps pulses over a wide wavelength range from 1000-1600nm at 76MHz. It can be frequency-locked to an external 76MHz reference.
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Hübner CWave laser
Type: Laser
Function: Using SHG and parametric downconversion, this CW laser system covers a large wavelength range from ~500 to ~3300nm.
Characterization equipment
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White light image setup
Type: Characterization setup
Function: The setup can take white light images of small structures with the resolution of several micrometers.
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Michelson interferometer
Type: Characterization setup
Function: The setup can measure the coherent time of the incident light, operating at the wavelength around 780nm.
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Single spectrometer
Type: Characterization setup
Function: The setup can take spectrums of the incident light.
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Indistinguishability setup
Type: Characterization setup
Function: The setup can measure the indistinguishability of the incident light with the wavelength around 780nm.
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Double spectrometer
Type: Characterization setup
Function: The setup can take spectrums of the incident light and has a higher resolution compared with the single spectrometer.
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Telecom-wavelength spectrometer
[Translate to English:] Type: Characterization setup
Function: The setup can take spectrums of the incident light at telecom-wavelength with high efficiency.